The multiple V-shaped double peeling of elastic thin films from elastic soft substrates
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چکیده
منابع مشابه
Buckling modes of elastic thin films on elastic substrates
Two buckling modes have been observed in thin films: buckle delamination and wrinkling. This letter identifies the conditions for selecting the favored buckling modes for elastic films on elastic substrates. Transition from one buckling mode to another is predicted as the stiffness ratio between the substrate and the film or is predicted for variation of the stiffness ratio between the substrat...
متن کاملThe macroscopic delamination of thin films from elastic substrates.
The wrinkling and delamination of stiff thin films adhered to a polymer substrate have important applications in "flexible electronics." The resulting periodic structures, when used for circuitry, have remarkable mechanical properties because stretching or twisting of the substrate is mostly accommodated through bending of the film, which minimizes fatigue or fracture. To date, applications in ...
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Article history: Received 3 December 2013 Received in revised form 8 July 2014 Available online 23 July 2014
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By Animangsu Ghatak1†, L. Mahadevan2 †, Jun Young Chung1, Manoj K. Chaudhury1 and Vijay Shenoy3 1Department of Chemical Engineering, Lehigh University, Bethlehem, PA 18015, USA ([email protected]) 2Department of Applied Mathematics and Theoretical Physics, University of Cambridge, Wilberforce Road, Cambridge CB3 0WA, UK 3Materials Research Centre, Indian Institute of Science, Bangalore 560 012, I...
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Using the T-Matrix or Null Field method elastic wave scattering from the following geometries have been studied {a) Rotationally symmetric configurations consisting of two spheroidal cavities separated by a finite distance and with different eccentricities. Exact calculations are compared with single scattering approximations. The frequency spectra are interpreted for various scattering geometr...
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ژورنال
عنوان ژورنال: Journal of the Mechanics and Physics of Solids
سال: 2018
ISSN: 0022-5096
DOI: 10.1016/j.jmps.2018.01.010